Interlaboratory Study: Laser-assisted Atom Probe Tomography (APT) of a Phosporous-Doped Silicon Specimen
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Abstract
Austin J Akey, David C Bell; Interlaboratory Study: Laser-assisted Atom Probe Tomography (APT) of a Phosporous-Doped Silicon Specimen, Microscopy and Micro
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Diamond and Carbon-based Materials Research
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References (3)
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1. 10.1016/j.ultramic.2012.10.00510.1016/j.ultramic.2012.10.005 ↗
2. This work was performed in part at the Center for Nanoscale Systems (CNS), a member of the National Nanotechnology Coordinated Infrastructure Network (NNCI), which is supported by the National Science Foundation under NSF award no. 1541959. CNS is part of Harvard University.
3. Prosa Ty J. , et al, Proceedings of the SPIE 9173, (2014), id. 917307 8 pp.10.1117/12.2062211 ↗