Understanding Nanoscale 4D Microstructural Evolution in Aluminum Alloys using Transmission X-Ray Microscopy (TXM)
Source abstract
Abstract
C Shashank Kaira, V De Andrade, S S Singh, C Kantzos, F De Carlo, Nikhilesh Chawla; Understanding Nanoscale 4D Microstructural Evolution in Aluminum Alloys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (4)
Show source-provided references
1. 10.1107/S160057751401393910.1107/S1600577514013939 ↗
2. De Andrade V. , et al Nanoscale 3D imaging at the Advanced Photon Source. SPIE Newsroom, 2016.10.1117/2.1201604.006461 ↗
3. Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM)
4. The authors are grateful for financial support from the Army Research Office (ARO) under Contract (No. W911NF1410550(Dr. David Stepp, Program Manager).