Microstructural and Nanomechanical Characterization of In-Situ He Implanted and Irradiated fcc Materials
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Abstract
P Hosemann, D Frazer, D Kaoumi, C Zheng; Microstructural and Nanomechanical Characterization of In-Situ He Implanted and Irradiated fcc Materials, Microsco
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Fusion materials and technologies · Metal and Thin Film Mechanics · Ion-surface interactions and analysis
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References (4)
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1. The Authors want to than the IVEM microscope at Argonne National Laboratory as well as the Molecular Foundry which is supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
2. 10.1016/j.actamat.2016.08.08510.1016/j.actamat.2016.08.085 ↗
3. 10.1016/j.jnucmat.2017.01.03610.1016/j.jnucmat.2017.01.036 ↗
4. 10.1002/jemt.2067010.1002/jemt.20670 ↗