journal article·2017-07Open access

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

William A. Hubbard, Toyanath Joshi, Matthew Mecklenburg, Brian Zutter, Pavel Borisov, David Lederman, B. C. Regan

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

William A Hubbard, Toyanath Joshi, Matthew Mecklenburg, Brian Zutter, Pavel Borisov, David Lederman, B C Regan; STEM EBIC Mapping of the Metal-Insulator Tr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · Electronic and Structural Properties of Oxides · Semiconductor materials and devices

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References (4)

Show source-provided references
1. 10.1006/jssc.1994.133410.1006/jssc.1994.1334 ↗
2. 10.1017/S143192761600711X10.1017/S143192761600711X ↗
3. This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA, as well as the Shared Research Facilities at WVU.
4. 10.1088/0022-3727/48/33/33530810.1088/0022-3727/48/33/335308 ↗