DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07

Correlated Transmission Electron Microscopy and Atom Probe Tomography study of Boron distribution in BGaN

Bastien Bonef, Richard Cramer, Feng Wu, James S. Speck

Microscopy and Microanalysis· Volume 23· Issue S1
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Source abstract

Abstract

Bastien Bonef, Richard Cramer, Feng Wu, James S Speck; Correlated Transmission Electron Microscopy and Atom Probe Tomography study of Boron distribution in
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Metal and Thin Film Mechanics · GaN-based semiconductor devices and materials · Semiconductor materials and devices

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References (4)

Show source-provided references
1. Rigutti L. , Bonef B. , Speck J. , Tang F. & Oliver R. A. (2017). Scripta Materialia.
2. 10.1063/1.472915410.1063/1.4729154 ↗
3. 10.1016/j.jcrysgro.2010.08.04210.1016/j.jcrysgro.2010.08.042 ↗
4. 10.1143/JJAP.32.441310.1143/JJAP.32.4413 ↗