journal article·2017-07Open access

Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks

Simon Hettler, Manuel Dries

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Simon Hettler, Manuel Dries; Non-Diffractive Electron Bessel Beams for Scanning Electron Microscopy in Transmission Mode Using Direct Phase Masks, Microsco
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Near-Field Optical Microscopy · Orbital Angular Momentum in Optics · Advanced Electron Microscopy Techniques and Applications

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References (6)

Show source-provided references
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5. S Hettler acknowledges funding from the Carl-Zeiss Stiftung.
6. 10.1016/j.ultramic.2016.03.00910.1016/j.ultramic.2016.03.009 ↗