STEM and TEM: Disparate Magnification Definitions and a Way Out.
Source abstract
Abstract
E Voelkl, David Hoyle, Jane Howe, H Inada, T Yotsuji; STEM and TEM: Disparate Magnification Definitions and a Way Out., Microscopy and Microanalysis, Volum
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Occupational health in dentistry · Education, Management, Technology, Human Resources
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References (1)
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1. http://www.jeol.de/electronoptics-en/products/electron-and-ion-optics/transmission-electron-microscopes/200-kv-tem-feg-tem/jem-f200.php.