In Situ Biasing of Conductive Bridge Resistive Memory Devices Observed in a Transmission Electron Microscope
Source abstract
Abstract
Remy Berthier, Cécile Nail, Catherine Carabasse, Gabriel Molas, David Cooper; In Situ Biasing of Conductive Bridge Resistive Memory Devices Observed in a T
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · Ferroelectric and Negative Capacitance Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. 10.1063/1.295906510.1063/1.2959065 ↗
2. 10.1063/1.298242610.1063/1.2982426 ↗
3. 10.1017/S143192761100410710.1017/S1431927611004107 ↗
4. 10.1109/TED.2015.247682510.1109/TED.2015.2476825 ↗
5. 10.1002/adma.20090037510.1002/adma.200900375 ↗