On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images
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Abstract
Jason Holm, Ryan White; On Mass-Thickness Contrast in Annular Dark-Field STEM-in-SEM Images, Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (3)
Show source-provided references
1. 10.1063/1.274533310.1063/1.2745333 ↗
2. 10.1016/j.ultramic.2016.05.00110.1016/j.ultramic.2016.05.001 ↗
3. This work is a contribution of the US Government and is not subject to United States copyright.