journal article·2002-08Open access

Electron Beam Induced Damage in Wurtzite InN

K. A. Mkhoyan, J. Silcox

Microscopy and Microanalysis· Volume 8· Issue S02

Abstract

K A Mkhoyan, J Silcox; Electron Beam Induced Damage in Wurtzite InN, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 628–629, https
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Anodic Oxide Films and Nanostructures · Semiconductor materials and devices · GaN-based semiconductor devices and materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

Reference metadata was not supplied for this record.