journal article·2016-11Open access

Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography

David Cooper, Nicolas Bernier, Christoph Baumer, Rafal Dunin-Borkowski, Regina Dittmann

Microscopy and Microanalysis· Volume 22· Issue S5

Abstract

David Cooper, Nicolas Bernier, Christoph Baumer, Rafal Dunin-Borkowski, Regina Dittmann; Direct Observation of Redox Switching in Resistive Memory Devices
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · Semiconductor materials and devices

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References (4)

Show source-provided references
1. 10.1038/nmat202310.1038/nmat2023 ↗
2. 10.1038/nature0275610.1038/nature02756 ↗
3. We acknowledge the European Research Council for funding the Starting Grant “Holoview”.
4. 10.1038/srep0697510.1038/srep06975 ↗