DataVXMicroscopy and MicroanalysisPaper
journal article·2016-07Open access

In Situ TEM Observation on Formation of Uniform Amorphous Layer on SnO 2 Nanotube

Joon Ha Chang, Jun Young Cheong, Il-Doo Kim, Jeong Yong Lee

Microscopy and Microanalysis· Volume 22· Issue S3
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Abstract

Joon Ha Chang, Jun Young Cheong, Il-Doo Kim, Jeong Yong Lee; In SituTEM Observation on Formation of Uniform Amorphous Layer on SnO 2 Nanotube, Microscopy a
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Research context

Nanomaterials

OpenAlex topics: Advancements in Battery Materials · Advanced Battery Technologies Research · Advanced Battery Materials and Technologies

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References (5)

Show source-provided references
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