journal article·2015-08Open access

High Spatial/Energy Resolution Band Gap Measurements: Delocalization and Other Effects in a Monochromated Cold FEG Nion Dedicated STEM

R. W. Carpenter, H. Xie, T. Aoki, F. A. Ponce

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

R W Carpenter, H Xie, T Aoki, F A Ponce; High Spatial/Energy Resolution Band Gap Measurements: Delocalization and Other Effects in a Monochromated Cold FEG
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (6)

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