Correlative Light and Electron Microscopy for Materials Science
Source abstract
Abstract
Jessica L Riesterer, Gregor Heiss; Correlative Light and Electron Microscopy for Materials Science, Microscopy and Microanalysis, Volume 21, Issue S3, 1 Au
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications
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References (2)
Show source-provided references
1. Proc. IISc · 1935 · 2 · 459
2. 10.1016/j.micromeso.2004.07.02910.1016/j.micromeso.2004.07.029 ↗