Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction
Source abstract
Abstract
Christoph Gammer, Burak V Özdöl, Karen C Bustillo, J Ciston, Andrew M Minor; Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Dif
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Microstructure and mechanical properties · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1016/j.ultramic.2015.03.01510.1016/j.ultramic.2015.03.015 ↗
2. 10.1063/1.492299410.1063/1.4922994 ↗
3. 10.1016/j.ultramic.2011.07.00110.1016/j.ultramic.2011.07.001 ↗