Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials
Source abstract
Abstract
Frédéric Voisard, Hendrix Demers, Michel Trudeau, George P Demopoulos, Raynald Gauvin, Karim Zaghib; Electron Dose Management for High Angle Annular Dark Field
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Photocathodes and Microchannel Plates
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References
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