Atomic Level Element Specific Investigation of Bimetallic Structures by Z-Contrast Imaging
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Abstract
M Cem Akatay, Sergio I Sanchez, Steven A Bradley; Atomic Level Element Specific Investigation of Bimetallic Structures by Z-Contrast Imaging, Microscopy an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
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2. 10.1016/j.matchar.2003.09.01310.1016/j.matchar.2003.09.013 ↗
3. 10.1038/nature0974110.1038/nature09741 ↗
4. ChemCatChem · 2013 · 5 · 673