Automated Analysis of Large Datasets Acquired with STEM Diffraction Mapping
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Abstract
Journal Article Automated Analysis of Large Datasets Acquired with STEM Diffraction Mapping Get access Christoph Gammer Christoph Gammer National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USAPhysics of Nanostructured Materials, Faculty of Physics, University of Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 2082–2083, https://doi.org/10.1017/S1431927616011259 Published: 25 July 2016
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Machine Learning in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
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2. 10.1016/j.ultramic.2015.03.01510.1016/j.ultramic.2015.03.015 ↗
3. 10.1021/acs.nanolett.5b0248310.1021/acs.nanolett.5b02483 ↗