Aberration Correction System Using Segmented Detector in STEM
Source abstract
Abstract
Y Kohno, H Sawada, N Shibata; Aberration Correction System Using Segmented Detector in STEM, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 20
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 10.1016/S0304-3991(99)00013-310.1016/S0304-3991(99)00013-3 ↗
2. 10.1093/jmicro/dfq01410.1093/jmicro/dfq014 ↗