Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

Sarah J. Haigh; Aidan P. Rooney; Eric Prestat; Fred. Withers; O. Del Pozo Zamudio; Artem Mishchenko; Ali. Gholinia; K. Watanabe; T. Taniguchi; A. I. Tartakovskii; Andre K. Geim; Konstantin. S. Novoselov

doi:10.1017/s1431927615001336

journal article·2015-08Open access

Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

Sarah J. Haigh, Aidan P. Rooney, Eric Prestat, Fred. Withers, O. Del Pozo Zamudio, Artem Mishchenko, Ali. Gholinia, K. Watanabe, T. Taniguchi, A. I. Tartakovskii, Andre K. Geim, Konstantin. S. Novoselov

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

Sarah J Haigh, Aidan P Rooney, Eric Prestat, Fred Withers, O Del Pozo Zamudio, Artem Mishchenko, Ali Gholinia, K Watanabe, T Taniguchi, A I Tartakovskii, A

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

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OpenAlex topics: 2D Materials and Applications · Ga2O3 and related materials · ZnO doping and properties

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