DataVXMicroscopy and MicroanalysisPaper
journal article·2016-07Open access

Practical Use of Scanning Low Energy Electron Microscope (SLEEM)

Ilona Müllerová, Eliška Mikmeková, Šárka Mikmeková, Ivo Konvalina, Luděk Frank

Microscopy and Microanalysis· Volume 22· Issue S3
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Abstract

Ilona Müllerová, Eliška Mikmeková, Šárka Mikmeková, Ivo Konvalina, Luděk Frank; Practical Use of Scanning Low Energy Electron Microscope (SLEEM), Microscop
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena

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References (2)

Show source-provided references
1. 10.1016/S1076-5670(03)80066-610.1016/S1076-5670(03)80066-6 ↗
2. 10.1007/s10853-006-7819-610.1007/s10853-006-7819-6 ↗