Evaluation of Neon Focused Ion Beam Milling for TEM Sample Preparation
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Abstract
T C Pekin, F I Allen, A M Minor; Evaluation of Neon Focused Ion Beam Milling for TEM Sample Preparation, Microscopy and Microanalysis, Volume 22, Issue S3,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
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References (8)
Show source-provided references
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