Correlative Microscopy using Serial Blockface Scanning EM
Source abstract
Abstract
Thomas Deerinck, Eric Bushong, Mark Ellisman; Correlative Microscopy using Serial Blockface Scanning EM, Microscopy and Microanalysis, Volume 21, Issue S3,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Fluorescence Microscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
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