Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution

H Yang; L Jones; R N Rutte; B D Davis; T J Pennycook; M Simson; M Huth; H Soltau; L Strüder; R Sagawa; Y Kondo; P D Nellist

doi:10.1017/s1431927616003391

journal article·2016-07Open access

Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution

H Yang, L Jones, R N Rutte, B D Davis, T J Pennycook, M Simson, M Huth, H Soltau, L Strüder, R Sagawa, Y Kondo, P D Nellist

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

H Yang, L Jones, R N Rutte, B D Davis, T J Pennycook, M Simson, M Huth, H Soltau, L Strüder, R Sagawa, Y Kondo, P D Nellist; Phase Imaging in STEM Allowing

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OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Digital Holography and Microscopy

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References (4)

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