journal article·2016-07

New Attempts on Preparing Tungsten FIB Sample

Pengcheng Zhang, Pengtao Chai, Xinai Zhao, Zhiwei Shan

Microscopy and Microanalysis· Volume 22· Issue S3
Publisher page

Abstract

Pengcheng Zhang, Pengtao Chai, Xinai Zhao, Zhiwei Shan; New Attempts on Preparing Tungsten FIB Sample, Microscopy and Microanalysis, Volume 22, Issue S3, 1
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (5)

Show source-provided references
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3. 10.1116/1.57650910.1116/1.576509 ↗
4. 10.1063/1.352988010.1063/1.3529880 ↗
5. Journal of Physics E-Scientific Instruments · 1972 · 5 · 10