Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector
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Abstract
Jason Holm, Robert Keller; Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Tr
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
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References (6)
Show source-provided references
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4. 10.1016/j.ultramic.2011.11.00210.1016/j.ultramic.2011.11.002 ↗
5. 10.1016/j.ultramic.2010.04.00410.1016/j.ultramic.2010.04.004 ↗
6. J. Electron Micros · 2001 · 50 · 147