Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM

H. Takahashi; S. Asahina; M. Terauchi; C. Nielsen; P. McSwiggen

doi:10.1017/s1431927615008958

journal article·2015-08

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM

H. Takahashi, S. Asahina, M. Terauchi, C. Nielsen, P. McSwiggen

Microscopy and Microanalysis· Volume 21· Issue S3

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Abstract

H Takahashi, S Asahina, M Terauchi, C Nielsen, P McSwiggen; Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: X-ray Spectroscopy and Fluorescence Analysis · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

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References (4)

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1. Microscopy and Microanalysis · 2013 · 19 · 125810.1017/S1431927613008283 ↗

2. 10.1017/S143192761400514510.1017/S1431927614005145 ↗

3. 10.1093/jmicro/dfr07610.1093/jmicro/dfr076 ↗

4. 10.1364/AO.51.00235110.1364/AO.51.002351 ↗