Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator
Source abstract
Abstract
Matthew Hiscock, Christian Lang, Peter Statham, Frank Bauer, Cheryl Hartfield; Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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