High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Electron Microscope with an Annular Silicon Drift Detector
Source abstract
Abstract
Hendrix Demers, Nicolas Brodusch, Patrick Woo, Raynald Gauvin; High Spatial Resolution Quantification X-ray Microanalysis in a Field Emission Scanning Elec
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (2)
Show source-provided references
1. 10.1017/S143192761009401810.1017/S1431927610094018 ↗
2. 10.1017/S143192761200146810.1017/S1431927612001468 ↗