Correlative SEM and Raman imaging of hot spots on SERS substrate
Source abstract
Abstract
R Vana, M Kocman, J Jiruse; Correlative SEM and Raman imaging of hot spots on SERS substrate, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 10.1116/1.489750210.1116/1.4897502 ↗
2. Microsc. Microanal · 2013 · 19 · 130210.1017/S1431927613008507 ↗