Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors
Source abstract
Abstract
Lewys Jones, Hao Yang, Katherine E MacArthur, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Peter D Nellist; O
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1063/1.490293910.1063/1.4902939 ↗
2. 10.1016/j.ultramic.2008.07.00110.1016/j.ultramic.2008.07.001 ↗
3. The authors thank Johnson Matthey for the PtCo sample and for financially supporting KEM · 1
4. 10.1016/0304-3991(94)00173-K10.1016/0304-3991(94)00173-K ↗