DataVXMicroscopy and MicroanalysisPaper
journal article·2016-07Open access

Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors

Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, Andreas Rosenauer

Microscopy and Microanalysis· Volume 22· Issue S3
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Abstract

Knut Müller-Caspary, Florian F Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena

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References (4)

Show source-provided references
1. 10.1038/ncomms665310.1038/ncomms6653 ↗
2. 10.1038/nphys233710.1038/nphys2337 ↗
3. 10.1063/1.476765510.1063/1.4767655 ↗
4. 10.1016/S0304-3991(78)80027-810.1016/S0304-3991(78)80027-8 ↗