Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads
Source abstract
Abstract
Shirley Mejia, Sean P Leary, Guilherme P Souza, Kurt C Ruthe; Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films o
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Diamond and Carbon-based Materials Research · Force Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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References (3)
Show source-provided references
1. 10.1002/sia.262210.1002/sia.2622 ↗
2. Mater. Sci. Eng. · 2002 · R37 · 129
3. Surf. Coat. Tech. · 2004 · 180 – 181 · 190