journal article·2015-08

An Improved TEM Sample Preparation Technique for Heavily Deformed Ceramic Materials having Extensive Sub-Surface Cracking

J.J. Swab, Weiss Brennan, S.D. Walck, J.C. LaSalvia, K.D. Behler

Microscopy and Microanalysis· Volume 21· Issue S3
Publisher page

Abstract

JJ Swab, Weiss Brennan, SD Walck, JC LaSalvia, KD Behler; An Improved TEM Sample Preparation Technique for Heavily Deformed Ceramic Materials having Extens
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Metallurgy and Material Forming

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References

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