Development of a Monochromated and Aberration-Corrected Low-Voltage (S)TEM
Source abstract
Abstract
Masaki Mukai, Shigeyuki Morishita, Atsushi Kimura, Akihiro Ikeda, Kazunori Somehara, Hidetaka Sawada, Luiz H G Tizei, Yung-Chang Lin, Koji Kimoto, Kazu Sue
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1016/j.ultramic.2014.02.00410.1016/j.ultramic.2014.02.004 ↗
2. 10.1093/jmicro/dfp03310.1093/jmicro/dfp033 ↗
3. 10.1038/nature0966410.1038/nature09664 ↗