Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks

Karl Hujsak; Benjamin D. Myers; Eric Roth; Yue Li; Vinayak P. Dravid

doi:10.1017/s1431927616008011

journal article·2016-07Open access

Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organizing Neural Networks

Karl Hujsak, Benjamin D. Myers, Eric Roth, Yue Li, Vinayak P. Dravid

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

Karl Hujsak, Benjamin D Myers, Eric Roth, Yue Li, Vinayak P Dravid; Reducing Electron Dose and Sample Damage with Bayesian Machine Learning and Self-Organi

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Nuclear Physics and Applications · Fault Detection and Control Systems

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References (4)

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4. 10.1016/j.ultramic.2012.07.01810.1016/j.ultramic.2012.07.018 ↗