Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset

R. dos Reis; C. Ophus; J. Ciston; P. Ercius; U. Dahmen

doi:10.1017/s1431927616003202

journal article·2016-07

Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset

R. dos Reis, C. Ophus, J. Ciston, P. Ercius, U. Dahmen

Microscopy and Microanalysis· Volume 22· Issue S3

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Abstract

R dos Reis, C Ophus, J Ciston, P Ercius, U Dahmen; Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset, Microscopy and Microanalysis, Vol

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Source: openalex_inverted_index · Quality: short

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OpenAlex topics: ZnO doping and properties · Electron and X-Ray Spectroscopy Techniques · Surface Roughness and Optical Measurements

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References (6)

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1. Microsc Microanal · 2015 · 21 · 109710.1017/S1431927615006273 ↗

2. 10.1063/1.492299410.1063/1.4922994 ↗

3. 10.1088/0034-4885/72/12/12650110.1088/0034-4885/72/12/126501 ↗

4. 10.1103/PhysRevLett.102.09610110.1103/PhysRevLett.102.096101 ↗

5. 2010

6. 10.1016/j.ultramic.2015.03.01510.1016/j.ultramic.2015.03.015 ↗