Strain Measurement through the Thickness of Crystal using DBI
Source abstract
Abstract
Mana Norouzpour, Rodney Herring; Strain Measurement through the Thickness of Crystal using DBI, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Non-Destructive Testing Techniques · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1093/jmicro/dfq01610.1093/jmicro/dfq016 ↗
2. M&M · 2011 · 1232
3. 10.1093/jmicro/dfn02710.1093/jmicro/dfn027 ↗