Optimizing the FEI Volta Phase Plate for Efficient and Artefact-free Data Acquisition
Source abstract
Abstract
Bart Buijsse, Radostin Danev, Kasim Sader, Sonja Welsch; Optimizing the FEI Volta Phase Plate for Efficient and Artefact-free Data Acquisition, Microscopy
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (2)
Show source-provided references
1. 10.1126/science.126119710.1126/science.1261197 ↗
2. 10.1038/ncomms1053410.1038/ncomms10534 ↗