High Efficiency Chemical State Surface Analysis Imaging with XPS
Source abstract
Abstract
Sankar Raman, John F Moulder, John S Hammond; High Efficiency Chemical State Surface Analysis Imaging with XPS, Microscopy and Microanalysis, Volume 21, Is
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
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References
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