Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification by TEM EDS
Source abstract
Abstract
P Statham, J Sagar, J Holland, J Manktelow, S Lozano-Perez; Mass Thickness Measurement in TEM: A New Single Standard Method for Convenient Quantification b
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Advancements in Photolithography Techniques
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References (5)
Show source-provided references
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2. 10.1007/BF0124455310.1007/BF01244553 ↗
3. 10.1017/S143192761005812510.1017/S1431927610058125 ↗
4. Microsc. Microanal · 2013 · 19 · 107410.1017/S1431927613007368 ↗
5. Microsc. Microanal · 2014 · 20 · 1318