FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations
Source abstract
Abstract
Ashley Sutor, Bryan Gauntt; FIB-assisted TEM Sample Preparation Refinement Using TRIM Simulations, Microscopy and Microanalysis, Volume 21, Issue S3, 1 Aug
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques
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References (3)
Show source-provided references
1. 10.1093/jmicro/dfh08010.1093/jmicro/dfh080 ↗
2. 1983 · 372
3. "TEM Sample Preparation and FIB-Induced Damage." MRS Bulletin · 2007 · 32 · 400