Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
Source abstract
Abstract
Matthew Weyland, Zhen Chen, Adrian J D’Alfonso, Yuman Zhu, Nikhil V Medhekar, Christian Dwyer, Daniel J Taplin, Scott D Findlay, Leslie J Allen; Making eve
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Corrosion Behavior and Inhibition · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
1. 10.1016/j.scriptamat.2015.01.00710.1016/j.scriptamat.2015.01.007 ↗
2. 10.1016/j.ultramic.2015.05.01010.1016/j.ultramic.2015.05.010 ↗
3. 10.1103/PhysRevLett.100.20610110.1103/PhysRevLett.100.206101 ↗
4. APL · 2012 · 100 · 191915