DataVXMicroscopy and MicroanalysisPaper
journal article·2015-08

Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography

Brian P. Gorman, David R. Diercks, Stephen Parman, Reid Cooper

Microscopy and Microanalysis· Volume 21· Issue S3
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Source abstract

Abstract

Brian P Gorman, David R Diercks, Stephen Parman, Reid Cooper; Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Diamond and Carbon-based Materials Research · Hydrogen embrittlement and corrosion behaviors in metals

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References (5)

Show source-provided references
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4. 10.1038/nature0704710.1038/nature07047 ↗
5. 10.1016/j.ultramic.2006.06.00810.1016/j.ultramic.2006.06.008 ↗