Atomic Scale In Situ Electron Microscopy: Challenges and Opportunities
Source abstract
Abstract
Journal Article Atomic Scale In Situ Electron Microscopy: Challenges and Opportunities Get access Joerg R Jinschek Joerg R Jinschek FEI Company, Materials Science BU, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 722–723, https://doi.org/10.1017/S1431927616004463 Published: 25 July 2016
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Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (6)
Show source-provided references
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