Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

C. Gatel; A. Masseboeuf; E. Snoeck; F. Bonnilla; T. Blon; L.-M. Lacroix; A. Meffre; J.F. Einsle; R.M. Bowman; M.A. Bashir; M. Gubbins

doi:10.1017/s1431927615011514

journal article·2015-08Open access

Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

C. Gatel, A. Masseboeuf, E. Snoeck, F. Bonnilla, T. Blon, L.-M. Lacroix, A. Meffre, J.F. Einsle, R.M. Bowman, M.A. Bashir, M. Gubbins

Microscopy and Microanalysis· Volume 21· Issue S3

Publisher page Open full text

Source abstract

Abstract

C Gatel, A Masseboeuf, E Snoeck, F Bonnilla, T Blon, L-M Lacroix, A Meffre, JF Einsle, RM Bowman, MA Bashir, M Gubbins; Off-Axis Electron Holography for th

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Magnetic properties of thin films · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (4)

Show source-provided references

1. 10.1021/nl301261610.1021/nl3012616 ↗

2. 10.1016/S0304-8853(98)00328-X10.1016/S0304-8853(98)00328-X ↗

3. 10.1021/ja805719c10.1021/ja805719c ↗

4. 10.1021/nl801998x10.1021/nl801998x ↗