Strain Mapping during In-situ Deformation using a High-Speed Electron Detector
Source abstract
Abstract
C Gammer, J Kacher, J Ciston, C Czarnik, OL Warren, AM Minor; Strain Mapping during In-situ Deformation using a High-Speed Electron Detector, Microscopy an
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced Electron Microscopy Techniques and Applications
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References (3)
Show source-provided references
1. 10.1016/S0304-3991(98)00035-710.1016/S0304-3991(98)00035-7 ↗
2. Microscopy and Microanalysis · 2014 · 20 · 1046
3. 10.1557/mrs.2014.30610.1557/mrs.2014.306 ↗