Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
Source abstract
Abstract
Lewys Jones, Katherine E MacArthur, Jolyon Aarons, Chris-Kriton Skylaris, Misbah Sarwar, Dogan Ozkaya, Peter D Nellist; Towards Statistically Representativ
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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References (3)
Show source-provided references
1. 10.1021/nl502762m10.1021/nl502762m ↗
2. 10.1016/j.ultramic.2008.07.00110.1016/j.ultramic.2008.07.001 ↗
3. 10.1038/nature0974110.1038/nature09741 ↗