Repetitive Observation of Coniferous Samples in ESEM and SEM
Source abstract
Abstract
E Tihlafikova, V Nedela; Repetitive Observation of Coniferous Samples in ESEM and SEM, Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pa
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1002/jemt.2243910.1002/jemt.22439 ↗
2. 10.1007/s00299-007-0429-110.1007/s00299-007-0429-1 ↗
3. 10.1017/S143192761300060310.1017/S1431927613000603 ↗