The Neon Focused Ion Beam-Stabilizing the Emission Process
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Abstract
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (6)
Show source-provided references
1. J. Vac. Sci. Technol. B · 2009 · 27
2. Vol 170 · 65
3. 10.1038/nnano.2015.7610.1038/nnano.2015.76 ↗
4. SPIE Scanning Microscopies · 2011 · 8036
5. 10.1007/s10854-013-1522-610.1007/s10854-013-1522-6 ↗
6. 10.1016/j.mee.2013.09.01810.1016/j.mee.2013.09.018 ↗